Sat-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent lines

By: Material type: ArticleArticleDescription: 2561-2567 pSubject(s): In: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Holdings
Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.E96-A, No.12 (Dec. 2013) Available

Visit counter For Websites

Copyright © 
Engr Abul Kalam Library, NEDUET, 2024