Sat-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent lines (Record no. 720722)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00631nab a2200169Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 230808s2013 |||||||f |||| 00| 0 eng d |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Yamashita, Jun |
| 9 (RLIN) | 715241 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Yotsuyanagi, Hiroyuki |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Hashizume, Masaki |
| 245 #0 - TITLE STATEMENT | |
| Title | Sat-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent lines |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 2561-2567 p. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Open Faults |
| 9 (RLIN) | 715244 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Adjacent lines |
| 9 (RLIN) | 715245 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Test Pattern Generation |
| 9 (RLIN) | 715246 |
| 773 ## - HOST ITEM ENTRY | |
| Place, publisher, and date of publication | 2013 |
| Title | IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences |
| International Standard Serial Number | 09168508 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Articles |
| -- | 51 |
| -- | ABUL KALAM Library |
| Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
|---|---|---|---|---|---|
| Engr Abul Kalam Library | Vol.E96-A, No.12 (Dec. 2013) | 19/08/2023 | Articles |