Sat-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent lines
Yamashita, Jun Yotsuyanagi, Hiroyuki Hashizume, Masaki
Sat-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent lines - 2561-2567 p.
Open Faults
Adjacent lines
Test Pattern Generation
Sat-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent lines - 2561-2567 p.
Open Faults
Adjacent lines
Test Pattern Generation