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Investigation of Hole-Tunneling Current Through Ultrathin Oxynitride/Oxide Stack Gate Dielectrics in P-Mosfets

Yu, H. Y Hou, Y.-T Li, M.-F Kwong, D.-L

Investigation of Hole-Tunneling Current Through Ultrathin Oxynitride/Oxide Stack Gate Dielectrics in P-Mosfets - 1158-1164 p.

Subjects--Topical Terms:
Hole Tunneling Current
Mosfet
No Stack

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