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		Encyclopedia of Materials Characterization Surfaces Interfaces Thin Films by Brundle, C. Richard [editor] Erans, Charles A [editor] Wilson, Shaun Wilson [editor] Series: Materials Characterization Series Material type: Text Language: English Publication details: Boston : Butterworth-Heinemann, c1992 Online access: Table of Contents Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 620.4403 ENC.
		Characterization of Composites Materials by Ishida, Hatsuo [editor] Series: Materials Characterization Series Material type: Text Language: English Publication details: Boston : Butterworth-Heinemann, c1994 Online access: Table of Contents Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 620.11827 ISH.
		Characterization of Integrated Circuit Packaging Materials by Moore, Thomas M [editor] Mckenna, Robert G [editor] Series: Materials Characterization Series Material type: Text Language: English Publication details: Boston : Butterworth-Heinemann, c1993 Online access: Table of Contents Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.381046 MOO.
		Characterization of Organic Thin Films by Ulman, Abraham [editor] Fitzpatrick, Lee E [editor] Series: Materials Characterization Series Material type: Text Language: English Publication details: Boston : Butterworth-Heinemann, c1995 Online access: Table of Contents Availability: Items available for loan: Circulation Section (2)Location, call number: Circulation Section 530.4175 ULM, ...
		Characterization in Silicon Processing by Strausser, Yale [editor] Series: Materials Characterization Series Material type: Text Language: English Publication details: Boston : Butterworth-Heinemann, c1993 Online access: Table of Contents Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 620.193 STR.

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