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		A Comprehensive Study of Indium Implantation-Induced Damage Indeep Submicrometer Nmosfet: Device Characterization and Damage Assessment by Liao, H. E Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Tied-Back Excavations in Alluvial Soil of Taipei by Liao, H. E Hsieh, P. C Source: Asce: Journal of Geotechnical and Geoenvironmental Engineering Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Determination of Nonlinear Delay Elements within Narma Models Using Dispersion Functions. by Chen, W. S Liao, H. E Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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