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Feature-Scale Process Simulation and Accurate Capacitance Extraction for Backend of A 100-Nm Aluminum/Teos Process by
  • Heitzinger, Clemens
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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An Extensible Tcad Optimization Framework Combining Gradient Based and Genetic Optimizer by
  • Heitzinger, Clemens
  • Selberherr, S
Source: Microelectronics Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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