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Built in Test for VLSI Pseudorandom Techniques

By: Contributor(s): Material type: TextTextLanguage: English Publication details: New York : John Wiley, c1987Description: XIII, 354 p. : illISBN:
  • 0471624632
Subject(s): DDC classification:
  • 621.395 BAR
Online resources:
Holdings
Item type Current library Shelving location Call number Status Date due Barcode
Lending Collection Lending Collection Circulation Section Circulation Section 621.395 BAR Available 67038
Lending Collection Lending Collection Circulation Section Circulation Section 621.395 BAR Available 67039

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