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Built in Test for VLSI Pseudorandom Techniques

Bardell, Paul H.

Built in Test for VLSI Pseudorandom Techniques - New York : John Wiley, c1987 - XIII, 354 p. : ill

Includes Bibliographical References and Index

ISBN: 0471624632

ISSN:

Subjects--Topical Terms:
Integrated Circuits Very Large Scale Integration Testing

Dewey Class. No.: 621.395 / BAR

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