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Band-Gap Narrowing and High-Frequency Characteristics of Si/Gexsi -Heterojunction Bipolar Transistors Formed by Ge Ion Ion Implantation in Si by
  • liu, Shau-Shen
  • Jang, Sheng-Lyang
  • Chyau, Chwan-GWO
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Compact Ldd Nmosfet Degradation Model by
  • lin, Shau-Shen
  • Jang, Sheng-Lyang
  • Chyau, Chwan-GWO
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Compact Pre-and Post-Stress I-V Model for Submicrometer Buried-Channel Pmosfet'S by
  • Chyau, Chwan-GWO
  • Jang, Sheng-Lyang
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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