A Compact Pre-and Post-Stress I-V Model for Submicrometer Buried-Channel Pmosfet'S

By: Material type: ArticleArticleDescription: 2167-2178 pSubject(s): In: IEEE Transactions on Electron Devices
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Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.45, No.10 (Oct. 1998) Available

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