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A System Lsi Memory Redundancy Technique Using An Ie-Flash (Inverse-Gate-Electrode Flash) Programming Circuit by
  • Yamaoka, M
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
0.13-/Um 32-Mb/64-Mb Embedded Dram Core with High Efficient Redundancy and Enhanced Testability by
  • Kikukawa, Hirohito
  • tomishima, Shigeki
  • Tsuji, Takaharu
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Application-Level Robustness and Redundancy in Linear Systems by
  • Alippi, C
Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Redundancy in Earthquake-Resistant Design. by
  • Bertero, Vitelmo V
  • Bertero, Raul D
Source: Asce: Journal of Structural Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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