0.13-/Um 32-Mb/64-Mb Embedded Dram Core with High Efficient Redundancy and Enhanced Testability

By: Material type: ArticleArticleDescription: 932-940 pSubject(s): In: Ieee Journal of Solid-State Circuits
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Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.37, No.07 (Jul. 2002) Available

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