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Soi Cmos Voltage Multiplier Circuits with Body Bias Control Technique for Battery-Less Wireless Sensor System by
  • Igarashi, Yasushi
  • Chiba, Tadashi
Source: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Elimination of Bipolar Induced Drain Breakdown and Single Transistor Latch in Submicron Pd Soi Mosfet by
  • Kumar, M Jagadesh
  • Verma, Vikram
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Thorough Investigation OfDegradation Induced by Hot-Carrier Injection in Deep Submicron N-and P-Channel Partialiy and Fuliy Depleted by
  • Renn, Shing-Hwa
  • Raynaud, Christing
  • Balestra, Francis
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
High-Current Smali-Parasitic-Capacitance Mosfet on a Poly-Si Interlayed (Psi-)Soi Wafer by
  • Horiuchi, M
  • Teshima, Kszuya
  • Yamaguchi, Ken
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
An Analytical Fuliy-Depleted Soi Mosfet Model ConsideringEffects of Self-Heating and Source /Drain Resistance by
  • Hu, Man-Chun
  • Jang, Sheng Lyang
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Physicaliy-Based Continuous Model for Accumulation-Mode Soi Pmosfet'S by
  • Iniguez, B
  • DesSARd, V
  • Flandre, D
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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