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		Sat-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent lines by Yamashita, Jun Yotsuyanagi, Hiroyuki Hashizume, Masaki Source: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		linear Feedback Shift Register Design Using Cyclic Codes by Mccluskey, Edward J Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Efficient Testing of Optimal Time Adders by Becker, Bernd Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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