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		Improved Hot-Carrier Reliability of Silicon-on-Insulator Transistors By Deuterium Passivation of Defects At Oxide/Silicon Interfaces by Cheng, K. T Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Vector Generation for Power Supply Noise Estimation and Verification of Deep Submicron Designs by Jiang, Y. M Cheng, K. T Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Test Point Selection for Analog Fault Diagnosis of Unpowered Circuit Boards. by Huang, J. L Cheng, K. T Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing) Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Efficient Test-Point Selection for Scan-Based Bist. by Tsai, H. C Cheng, K. T Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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