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		Low-Voltage Hot Electrons and Soft-Programming lifetime Prediction in Nonvolatile Memory Celis by Ghetti, andrea Selmi, Luca Bez, Roberto Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Verifiction of Electron Distribution in Silicon by Means of Hot Carrier Luminescence Measurements by Selmi, Luca Mastrapasqua, M Bude, J Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Monitoring Hot-Carrier Degradation in Soi Mosfets' by Hot -Carrier Luminescence Techniques by Selmi, Luca Wong, H-S. Philip Sangiorgi, Enrico Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Investigation ofEnergy Distribution of Stress-Induced Oxide Traps By Numerical Analysis ofTat of Hes by Driussi, Francesco Iob, Romano Selmi, Luca Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Methodology to ExtractChannel Current of Permeable Gate Oxide Mosfets by Palestri, Pierpaolo Esseni, David Selmi, Luca Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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