Monitoring Hot-Carrier Degradation in Soi Mosfets' by Hot -Carrier Luminescence Techniques

By: Material type: ArticleArticleDescription: 1135-1139 pSubject(s): In: IEEE Transactions on Electron Devices
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Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.45, No.05 (May. 1998) Available

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