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A Thorough Investigation OfDegradation Induced by Hot-Carrier Injection in Deep Submicron N-and P-Channel Partialiy and Fuliy Depleted by
  • Renn, Shing-Hwa
  • Raynaud, Christing
  • Balestra, Francis
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Hot-Carrier Effects and lifetime Prediction in Off-State Operation of Deep Submicron Soi N-Mosfet'S by
  • Renn, Shing-Hwa
  • Pelioie, Jean-Luc
  • Balestra, Francis
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
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