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		Relation Between Low-Frequency Noise and Long-Term Reliability of Single Algaas/Gaas Power Hbt'S by Mohammadi, Saeed Seif Pavlidis, Dimitris Bayraktaroglu, Burhan Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Enhanced Transmission line Model Structures for Accurate Resistance Evaluation of Smali-Size Contacts and for More Reliable Fabrication by Sawdai, Donald Pavlidis, Dimitris Cui, Delong Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Comparison of Low-Frequency Noise Characteristics and Noise Sources in Npn and Pnp Inp-Based Heterojunction Bipolar Transistors by Hsu, Shawn S H Pavlidis, Dimitris Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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