Relation Between Low-Frequency Noise and Long-Term Reliability of Single Algaas/Gaas Power Hbt'S

By: Material type: ArticleArticleDescription: 677-686 pSubject(s): In: IEEE Transactions on Electron Devices
Holdings
Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.47, No.04 (Apr. 2000) Available