Relation Between Low-Frequency Noise and Long-Term Reliability of Single Algaas/Gaas Power Hbt'S (Record no. 741702)

MARC details
000 -LEADER
fixed length control field 00582nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s2000 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Mohammadi, Saeed Seif
9 (RLIN) 716112
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Pavlidis, Dimitris
9 (RLIN) 771970
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Bayraktaroglu, Burhan
9 (RLIN) 771971
245 #0 - TITLE STATEMENT
Title Relation Between Low-Frequency Noise and Long-Term Reliability of Single Algaas/Gaas Power Hbt'S
300 ## - PHYSICAL DESCRIPTION
Extent 677-686 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Relationship
9 (RLIN) 740908
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Noise
9 (RLIN) 92865
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Long Term Change
9 (RLIN) 720005
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 2000
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
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Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
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