Your search returned 3 results.

Results
		Interaction of Interface-Traps Located at Various Sites in Mosfets Under Stress by Chen, Gang li, M. F Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Investigation of Hole-Tunneling Current Through Ultrathin Oxynitride/Oxide Stack Gate Dielectrics in P-Mosfets by Yu, H. Y Hou, Y.-T Li, M.-F Kwong, D.-L Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Low-Voltage Cmos Ota with Rail-to -Rail Diferential Input Range. by Zhang, X. W Dasgupta, U Li, M. F Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Refine your search