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		A Steady Stated Drain Current Technique for Generation and Recombinaton lifetime Measurement InSoi Mosfet by Cheng, Zhi-Uuan ling, C. H Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Fuliy Depleted Cmos/Soi Device Design Guidelines for Low-Power Applications by Banna, Srinivasa R Chan, Philip C. H Chan, Mansun Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Thin Silicide Development for Fuliy-Depleted Soi Cmos Technology by liu, Harvey I Burns, James A Wyatt, Peter W Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Unified Understanding on Fuliy-Depleted Soi Nmosfet Hot-Carrier Degradation by Banna, Srinivasa R Chan, Philip C. H Fung, Samuel K. H Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		SuppressingParasitic Bipolar Action in Fuliy-Depleted Mosfet''S/Simox by Using Back-Side Bias-Temperature Treatment by Koizumi, H Tsuchiya, Toshiaki Shimaya, Maskazu Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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