A Unified Understanding on Fuliy-Depleted Soi Nmosfet Hot-Carrier Degradation

By: Material type: ArticleArticleDescription: 206-212 pSubject(s): In: IEEE Transactions on Electron Devices
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Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.45, No.01 (Jan. 1998) Available

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