Normal view MARC view ISBD view

A Unified Understanding on Fuliy-Depleted Soi Nmosfet Hot-Carrier Degradation

Banna, Srinivasa R. Chan, Philip C. H. Fung, Samuel K. H.

A Unified Understanding on Fuliy-Depleted Soi Nmosfet Hot-Carrier Degradation - 206-212 p.

Subjects--Topical Terms:
Degradation
Fuliy-Depleted Soi Mosfet
Hot Carrier

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)