Parity Bit Signature in Response Data Compaction and Built -In Self-Testing of Vlsi Circuits with Nonexhaustive Test Sets

By: Material type: ArticleArticleDescription: 1363-1380 pSubject(s): In: Ieee Transactions on Instrumentation and Measurement
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Articles Articles Periodical Section Vol.52, No.05 (Oct. 2003) Available

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