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Parity Bit Signature in Response Data Compaction and Built -In Self-Testing of Vlsi Circuits with Nonexhaustive Test Sets

Das, S Sudarma, Made

Parity Bit Signature in Response Data Compaction and Built -In Self-Testing of Vlsi Circuits with Nonexhaustive Test Sets - 1363-1380 p.

Subjects--Topical Terms:
Data Compaction

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