Cycling Endurance of Nor Flash Eeprom Cells Under Chisel Programming Operation---Impact of Technological Parameters and Scaling

By: Material type: ArticleArticleDescription: 1672-1679 pSubject(s): In: Ieee Transactions on Electron Devices
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Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.51, No.10 (Oct. 2004) Available

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