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Cycling Endurance of Nor Flash Eeprom Cells Under Chisel Programming Operation---Impact of Technological Parameters and Scaling

Nair, Deleep R Shukuri, S Mahapatra, S

Cycling Endurance of Nor Flash Eeprom Cells Under Chisel Programming Operation---Impact of Technological Parameters and Scaling - 1672-1679 p.

Subjects--Topical Terms:
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Device Scaling

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