A Critique OfReliability Analysis Center Failure-Rate-Model for Plastic Encapsulated Microcircuits

By: Material type: ArticleArticleDescription: 110-113 pSubject(s): In: IEEE Transactions on Reliability
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Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.47, No.02 (Jun. 1998) Available

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