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A Critique OfReliability Analysis Center Failure-Rate-Model for Plastic Encapsulated Microcircuits

Shukla, Anand A. Pecht, Michael G.

A Critique OfReliability Analysis Center Failure-Rate-Model for Plastic Encapsulated Microcircuits - 110-113 p.

Subjects--Topical Terms:
Reliability Assessment
Reliability Modeling
Plastic Encapsulated Microcircuit (Pem)

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