Ultralow-Noise Pc-Based Measurement System for Characterization ofMetallizations of Integrated Circuits. (Record no. 804155)

MARC details
000 -LEADER
fixed length control field 00547nab a2200157Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1997 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Neri, B
9 (RLIN) 863168
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name De Marinis, M
9 (RLIN) 863169
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Clofi, C
9 (RLIN) 863170
245 #0 - TITLE STATEMENT
Title Ultralow-Noise Pc-Based Measurement System for Characterization ofMetallizations of Integrated Circuits.
300 ## - PHYSICAL DESCRIPTION
Extent 789-793 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Data Acquisition
9 (RLIN) 93698
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Digital Control
9 (RLIN) 165157
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1997
Title Ieee Transactions on Instrumentation and Measurement
International Standard Serial Number 00189456
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
-- 51
-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.46, No.04 (Aug. 1997)   20/08/2023 Articles
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