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Ultralow-Noise Pc-Based Measurement System for Characterization ofMetallizations of Integrated Circuits.

Neri, B De Marinis, M Clofi, C

Ultralow-Noise Pc-Based Measurement System for Characterization ofMetallizations of Integrated Circuits. - 789-793 p.

Subjects--Topical Terms:
Data Acquisition
Digital Control

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