Two-Dimensional Doping Profile Characterization of Mosfet'S by Inverse Modeling Using Characteristics InSubthreshold Region (Record no. 744786)

MARC details
000 -LEADER
fixed length control field 00619nab a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230808s1999 |||||||f |||| 00| 0 eng d
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Lee, Zachary K.
9 (RLIN) 779467
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Mclirath, Michael B.
9 (RLIN) 779468
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Antoniadis, Dimitri A.
9 (RLIN) 779471
245 #0 - TITLE STATEMENT
Title Two-Dimensional Doping Profile Characterization of Mosfet'S by Inverse Modeling Using Characteristics InSubthreshold Region
300 ## - PHYSICAL DESCRIPTION
Extent 1640-1649 p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Doping Profiles
9 (RLIN) 779472
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Halo Doping
9 (RLIN) 717361
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Inverse Modelilng
9 (RLIN) 698750
773 ## - HOST ITEM ENTRY
Place, publisher, and date of publication 1999
Title IEEE Transactions on Electron Devices
International Standard Serial Number 00189383
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Articles
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-- ABUL KALAM Library
Holdings
Not for loan Home library Serial Enumeration / chronology Total Checkouts Date last seen Koha item type
  Engr Abul Kalam Library Vol.46, No.08 (Aug. 1999)   19/08/2023 Articles
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