Normal view MARC view ISBD view

Two-Dimensional Doping Profile Characterization of Mosfet'S by Inverse Modeling Using Characteristics InSubthreshold Region

Lee, Zachary K. Mclirath, Michael B. Antoniadis, Dimitri A.

Two-Dimensional Doping Profile Characterization of Mosfet'S by Inverse Modeling Using Characteristics InSubthreshold Region - 1640-1649 p.

Subjects--Topical Terms:
Doping Profiles
Halo Doping
Inverse Modelilng

Print
Request article
Suggest for purchase
Send to device
Save record
BIBTEX Dublin Core ISBD MARCXML RIS
More searches

Search for this title in:
Other Databases (Google Scholar) Open Library (openlibrary.org) Pakistan Union Catalogue (pastic.gov.pk) Other Libraries (WorldCat)