A Steady Stated Drain Current Technique for Generation and Recombinaton lifetime Measurement InSoi Mosfet (Record no. 741694)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 00575nab a2200157Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 230808s2000 |||||||f |||| 00| 0 eng d |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Cheng, Zhi-Uuan |
| 9 (RLIN) | 771952 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | ling, C. H. |
| 9 (RLIN) | 771953 |
| 245 #2 - TITLE STATEMENT | |
| Title | A Steady Stated Drain Current Technique for Generation and Recombinaton lifetime Measurement InSoi Mosfet |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 97-102 p. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Carrier Generation lifetime |
| 9 (RLIN) | 771954 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Fuliy-Depleted Soi Mosfet |
| 9 (RLIN) | 771955 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Recombination lifetime |
| 9 (RLIN) | 771956 |
| 773 ## - HOST ITEM ENTRY | |
| Place, publisher, and date of publication | 2000 |
| Title | IEEE Transactions on Electron Devices |
| International Standard Serial Number | 00189383 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Articles |
| -- | 51 |
| -- | ABUL KALAM Library |
| Not for loan | Home library | Serial Enumeration / chronology | Total Checkouts | Date last seen | Koha item type |
|---|---|---|---|---|---|
| Engr Abul Kalam Library | Vol.47, No.01 (Jan. 2000) | 19/08/2023 | Articles |