| 000 | 00370nab a2200121Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1995 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aChen, Jwu E _9818910 |
||
| 100 |
_aLiang, Hsing-Chung _9864941 |
||
| 245 | 0 | _aIdentifying Untestable Faults in Sequential Circuits. | |
| 300 | _a14-23 p. | ||
| 773 |
_d1995 _tIeee Design and Test of Computers _x07407475 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c805893 _d805893 |
||