| 000 | 00547nab a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1997 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aNeri, B _9863168 |
||
| 100 |
_aDe Marinis, M _9863169 |
||
| 100 |
_aClofi, C _9863170 |
||
| 245 | 0 | _aUltralow-Noise Pc-Based Measurement System for Characterization ofMetallizations of Integrated Circuits. | |
| 300 | _a789-793 p. | ||
| 650 |
_aData Acquisition _993698 |
||
| 650 |
_aDigital Control _9165157 |
||
| 773 |
_d1997 _tIeee Transactions on Instrumentation and Measurement _x00189456 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c804155 _d804155 |
||