| 000 | 00406nab a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s1998 |||||||f |||| 00| 0 eng d | ||
| 100 | _aSrinivasan, R | ||
| 100 |
_aGupta, S. K _9773897 |
||
| 245 | 0 | _aBounds on Pseudoexhaustie Test Lengths. | |
| 300 | _a420-431 p. | ||
| 650 |
_aLfsr _9783091 |
||
| 773 |
_d1998 _tIeee Transactions on Very Large Scale Intergration (Vlsi) Systems _x10638210 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c797199 _d797199 |
||