000 00426nab a2200133Ia 4500
008 230808s1998 |||||||f |||| 00| 0 eng d
100 _aMurray, B. T
_9840978
100 _aLyengar, V
_9816954
245 0 _aHuffman Encoding of Test Sets for Sequential Circuits.
300 _a21-25 p.
650 _aDecoding Methods
_9853807
773 _d1998
_tIeee Transactions on Instrumentation and Measurement
_x00189456
942 _cART
_o51
_pABUL KALAM Library
999 _c794999
_d794999