| 000 | 00595nab a2200145Ia 4500 | ||
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| 008 | 230808s2000 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aRaahemifar, K _9841463 |
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| 100 |
_aAhmadi, M _9736039 |
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| 245 | 0 | _aDesign- for -Testability Techniques for Detecting Delay Faults in Cmos/Bicomos Logic Families. | |
| 300 | _a1279-1290 p. | ||
| 650 |
_aConcurrent Testing _9772998 |
||
| 650 |
_aDelay Fault and Stuck Open Fault Testing _9841464 |
||
| 773 |
_d2000 _tIeee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing) _x10577130 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
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| 999 |
_c786255 _d786255 |
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