| 000 | 00519nab a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aCatelani, M. _9820319 |
||
| 245 | 0 | _aAutomatic Measurement System for Degradation Analysis in Thin-Film Aicu Metallizations | |
| 300 | _a401-407 p. | ||
| 650 |
_aAutomatic _9675153 |
||
| 650 |
_aMeasurement System Data Handling _9826529 |
||
| 650 |
_aThin - Film Devices _9235439 |
||
| 773 |
_d2002 _tIeee Transactions on Instrumentation and Measurement _x00189456 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c775637 _d775637 |
||