| 000 | 00468nab a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aCheng, K. T _9825617 |
||
| 245 | 0 | _aImproved Hot-Carrier Reliability of Silicon-on-Insulator Transistors By Deuterium Passivation of Defects At Oxide/Silicon Interfaces | |
| 300 | _a529-531 p. | ||
| 650 | _aSilicon | ||
| 650 | _aSilicon Devices | ||
| 773 |
_d2002 _tIeee Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c775047 _d775047 |
||