| 000 | 00503nab a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aHamdioui, Said _9825048 |
||
| 100 |
_aGoor, Ad J. Van De _9808903 |
||
| 245 | 0 | _aEfficient Tests for Realistic Faults in Dual-Port Srams | |
| 300 | _a460-473 p. | ||
| 650 |
_aMultiport/Single-Port Memories _9756817 |
||
| 650 |
_aFault Models _9772975 |
||
| 650 |
_aWeak Faults _9822940 |
||
| 773 |
_d2002 _tIEEE TransactionsonComputers _x00189340 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c774699 _d774699 |
||