| 000 | 00603nab a2200181Ia 4500 | ||
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| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aYu, H. Y _9821569 |
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| 100 |
_aHou, Y.-T _9799443 |
||
| 100 |
_aLi, M.-F _9768168 |
||
| 100 |
_aKwong, D.-L _9821570 |
||
| 245 | 0 | _aInvestigation of Hole-Tunneling Current Through Ultrathin Oxynitride/Oxide Stack Gate Dielectrics in P-Mosfets | |
| 300 | _a1158-1164 p. | ||
| 650 |
_aHole Tunneling Current _9821571 |
||
| 650 |
_aMosfet _9720139 |
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| 650 |
_aNo Stack _9821573 |
||
| 773 |
_d2002 _tIeee Transactions on Electron Devices _x00189383 |
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| 942 |
_cART _o51 _pABUL KALAM Library |
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| 999 |
_c772295 _d772295 |
||