| 000 | 00348nab a2200121Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2003 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aBaumann, R. _9818014 |
||
| 245 | 0 | _aImpact of Single-Event Upsets in Deep-Submicronsilicon Technology | |
| 300 | _a117-120 p. | ||
| 650 | _aProbability | ||
| 773 |
_d2003 _tMrs Bulletin _x08837694 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c769842 _d769842 |
||