| 000 | 00488nab a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aKato, K _9775147 |
||
| 100 |
_aMizutani, T. _9757315 |
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| 245 | 0 | _aContact Potential Measurement of Cleaved Mirror Surface of 1.3 Um Buried Heterostructure Laser Diode By Kelvin Probe Force Microscopy | |
| 300 | _a1662-1662 p. | ||
| 650 | _aInstrumentation and Measurement | ||
| 773 |
_d2002 _tIET:IEE: Electronics Letters _x00135194 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c767530 _d767530 |
||