| 000 | 00408nab a2200121Ia 4500 | ||
|---|---|---|---|
| 008 | 230808s2002 |||||||f |||| 00| 0 eng d | ||
| 100 |
_aWang, J. _9675273 |
||
| 245 | 0 | _aRole of Positive Trapped Charge in Stress-Induced Leakage Current for Flash Eeprom Devices | |
| 300 | _a1910-1916 p. | ||
| 650 |
_aFlash Eeprom _9776852 |
||
| 773 |
_d2002 _tIeee Transactions on Electron Devices _x00189383 |
||
| 942 |
_cART _o51 _pABUL KALAM Library |
||
| 999 |
_c765558 _d765558 |
||