000 00419nab a2200121Ia 4500
008 230808s2003 |||||||f |||| 00| 0 eng d
100 _aJone, Wen-Ben
_9772978
245 3 _aAn Efficient Method for Non-Traditional Faults of Embedded Memory Arrays
300 _a1381-1390 p.
650 _aBuilt-In Self-Testing
_9810957
773 _d2003
_tIeee Transactions on Instrumentation and Measurement
_x00189456
942 _cART
_o51
_pABUL KALAM Library
999 _c763534
_d763534